Publications by Date

2005

Agilent sales mark "end of an era"
OE Magazine / Nov/Dec 2005 / pg. 10
Growth in microelectronics, flat panels makes materials processing lasers more attractive
OE Magazine / August 2005 / pg. 36
Most US federal research spending likely to drop in 2006
OE Magazine / August 2005 / pg. 12
Spectroscopy systems become smaller, cheaper, easier to use
OE Magazine / Nov/Dec 2005 / pg. 37
DPSS lasers aim for right combination of power, wavelength, and cost
OE Magazine / October 2005 / pg. 37
Energy bill authorizes $350 million for solid-state lighting development
OE Magazine / October 2005 / pg. 10
Laser pulses deep into the ultraviolet could lead to new levels of spectroscopy
OE Magazine / October 2005 / pg. 5 / view site
TR-35 profiles: Aarabi, Barzilay, Blackwell, Carvin, Chen, Crowley, Manohar
Technology Review / October 2005 / pg. 41 / view site
Approved fusion project will need metrology equipment from photonics industry
OE Magazine / September 2005 / pg. 11
Mirror, mirror off the shelf
OE Magazine / September 2005 / pg. 37
Supercooled superfluid could lead to novel understanding of matter
OE Magazine / September 2005 / pg. 6 / view site
Antigay psychologist says gays more likely to drink and drive
Advocate.com / Aug. 13, 2005 / website / view site
Reversing index of refraction helps researchers beat diffraction limit
OE Magazine / August 2005 / pg. 8 / view site
Author of new bisexuality study has always been controversial
Advocate.com / July 7, 2005 / website / view site
2-D spectroscopy yields information on how energy moves between molecules
OE Magazine / June/July 2005 / pg. 7 / view site
Low-loss optical switches offer new options for rerouting light
OE Magazine / June/July 2005 / pg. 44
US faces increasing competition from Asia in science and technology
OE Magazine / June/July 2005 / pg. 12
EU falling behind in science, needs more money, says report
OE Magazine / May 2005 / pg. 11
Photonic crystal fibers extend beam-carrying capability to new wavelengths, new applications
OE Magazine / May 2005 / pg. 36
Researchers work to extend semiconductor metrology to features of 40-nm and below
OE Magazine / May 2005 / pg. 7 / view site

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